Noise in devices and circuits : 2-4 June, 2003, Santa Fe, new Mexico, USA 
M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering 
 - Bellingham, WA  SPIE  c2003 
 - xxi, 516 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819449733 
<br/><br/><label>ISSN: </label>2003284227 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electric circuits - Noise - Congresses<br/>Electric noise - Congresses<br/>Electronic circuits - Noise - Congresses<br/>Electronic noise - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.38224 DEE