Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy 
Massimo Macucci ... [et al.], editors ; sponsored and published by SPIE 
 - Bellingham, WA  SPIE  2007 
 - 1 v. (various pagings) : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819467379 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic noise -- Congresses<br/>Fluctuations (Physics) -- Congresses<br/>Noise control -- Congresses
<br/><br/><label>Dewey Class. No.: </label>621 MAC