Tiziani, Hans J <br/><br/>
Laser metrology and inspection : 14-15 June 1999, Munich, Germany 
Hans J.Tiziani 
 - Bellingham, WA  SPIE - Proceeding  1999 
 - vii,298 p. : ill. 28 cm 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9780819433091 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering inspection<br/>Lasers--Industrial applications
<br/><br/><label>Dewey Class. No.: </label>621.366 TIZ