Kapur, P. K <br/><br/>
International conference on quality reliability and infocom technology (ICQRIT - 06) 
P. K. Kapur and A. K. Verma 
 - New Delhi  Macmillan India Ltd  2007 
 - xiii, 655 p. : ill 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9780230634015 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability modelling
<br/><br/><label>Dewey Class. No.: </label>620.0045 KAP