Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA 
Katherine Creath, Joanna Schmit, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.] 
 - Bellingham, WA  SPIE  c2002 
 - xii, 426 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819445445 
<br/><br/><label>ISSN: </label>2002512371 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Interferometry - Congresses<br/>Metrology - Congresses
<br/><br/><label>Dewey Class. No.: </label>535.470287 CRE