Infrared materials, devices, and applications : 12-15 November 2007, Beijing, China 
Yi Cai, Haimei Gong, Jean-Pierre Chatard, editors ; sponsored by SPIE [and] COS--Chinese Optical Society ; cooperating organizations, OSJ--Optical Society of Japan ... [et al.] ; supporting organizations, CAST--China Association for Science and Technology (China), NNSF--National Nature Science Foundation (China), [and] the Ministry of Science and Technology (China) 
 - Bellingham, WA  SPIE  2008 
 - 1 v. (various pagings) : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819470102 
<br/><br/><label>ISSN: </label>2010455634 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Infrared detectors - Materials - Congresses<br/>Infrared equipment - Congresses<br/>Infrared imaging - Congresses<br/>Infrared technology - Congresses<br/>Optoelectronic devices - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.362 CAI