Lall, Pradeep <br/><br/>
Influence of temperature on microelectronics and system reliability 
Pradeep Lall, Michael G. Pecht, Edward B. Hakim 
 - Boca Raton, FL  CRC Press  c1997 
 - 307 p. : ill. ; 26 cm 
<br/><br/> Includes bibliographical references (p. [257]-291) and index 
<br/><br/><label>ISBN: </label>9780849394508 
<br/><br/><label>ISSN: </label>96039038 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances - Reliability<br/>Electronic packaging<br/>Microelectronics - Materials - Thermal properties
<br/><br/><label>Dewey Class. No.: </label>621.381046 LAL