Industrial applications of optical inspection, metrology, and sensing : 19-20 November 1992, Boston, Massachusetts 
Gordon M. Brown, Kevin G. Harding, H. Philip Stahl, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering 
 - Bellingham, WA  SPIE  c1993 
 - viii, 480 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819410221 
<br/><br/><label>ISSN: </label>93063074 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical detectors - Industrial applications - Congresses<br/>Optical instruments - Industrial applications - Congresses<br/>Quality control - Optical methods - Congresses
<br/><br/><label>Dewey Class. No.: </label>670.425 BRO