Impact of electron and scanning probe microscopy on materials research 
edited by David G. Rickerby, Giovanni, Valdrč, Ugo Valdrč 
 - Dordrecht ; Boston  Kluwer Academic Publishers  1999 
 - xxiv, 489 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780792359395 
<br/><br/><label>ISSN: </label>99042003 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy<br/>Materials - Microscopy<br/>Scanning probe microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825028407 RIC