TY  - BOOK
AU  - Pietsch, Ullrich
AU  - Baumbach, Tilo
AU  - Holý, Václav
TI  - High-resolution x-ray scattering : from thin films to lateral nanostructures
SN  - 9780387400921
SN  - 200307036
U1  - 530.4175 PIE 
PY  - 2004///
CY  - Berlin
PB  - Springer
KW  - Nanostructured materials
KW  - Thin films - Optical properties
KW  - X-rays - Diffraction
KW  - X-rays - Scattering
N1  - Includes bibliographical references (p. [389]-402) and index
ER  -