Frontiers in pathogen detection : from nanosensors to systems : 23-25 January 2010, San Francisco, California, United States 
Philippe M. Fauchet, Benjamin L. Miller, editors ; sponsored ... by SPIE 
 - Bellingham, WA  SPIE  2010 
 - 1 online resource : ill. (some col.) 25cm 
<br/><br/><label>ISBN: </label>9780819479495 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Micro-organismes pathogènes -- Détection -- Congrès<br/>Pathogenic microorganisms -- Detection -- Congresses<br/>Pathogenic microorganisms -- Identification -- Congresses
<br/><br/><label>Dewey Class. No.: </label>610 FAU