Khare, Jitendra B <br/><br/>
From contamination to defects, faults, and yield loss : simulation and applications 
by Jitendra B. Khare, Wojciech Maly 
 - Dordrecht ; Boston  Kluwer Academic Publishers  c1996 
 - 150 p. : ill. ; 24 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780792397144 
<br/><br/><label>ISSN: </label>96005441 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer-aided design<br/>Integrated circuits - Very large scale integration - Computer simulation<br/>Integrated circuits - Very large scale integration - Defects<br/>Integrated circuits - Very large scale integration - Testing
<br/><br/><label>Dewey Class. No.: </label>621.381520685 KHA