Focused ion beam systems : basics and applications 
edited by Nan Yao 
 - Cambridge  Cambridge University Press  2007 
 - xi, 395 p. : ill. ; 26 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780521831994 
<br/><br/><label>ISSN: </label>2007300349 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Focused ion beams<br/>Focused ion beams - Industrial applications<br/>Ion bombardment
<br/><br/><label>Dewey Class. No.: </label>624.17723 YAO