Multi-chip module test strategies 
edited by Yervant Zorian 
 - Deventer, The Netherlands ; Boston, MA  Kluwer  1997 
 - 166 p. : ill. ; 27 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780792399209 
<br/><br/><label>ISSN: </label>97008206 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Multichip modules (Microelectronics) - Testing
<br/><br/><label>Dewey Class. No.: </label>621.381046 ZOR