TY  - BOOK
AU  - Heyman, Joseph S
ED  - Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center)
TI  - Electronics reliability and measurement technology : nondestructive evaluation
SN  - 9780815511717
SN  - 88025395
U1  - 621.3810287 HEY 
PY  - 1988///
CY  - Park Ridge, N.J
PB  - Noyes Data Corp
KW  - Integrated circuits - Reliability - Congresses
KW  - Integrated circuits - Testing - Congresses
KW  - Nondestructive testing - Congresses
N1  - Includes bibliographical reference and index
ER  -