Electronics reliability and measurement technology : nondestructive evaluation 
edited by Joseph S. Heyman 
 - Park Ridge, N.J  Noyes Data Corp  1988 
 - xii, 128 p. : ill. ; 27 cm 
<br/><br/> Includes bibliographical reference and index 
<br/><br/><label>ISBN: </label>9780815511717 
<br/><br/><label>ISSN: </label>88025395 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits - Reliability - Congresses<br/>Integrated circuits - Testing - Congresses<br/>Nondestructive testing - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.3810287 HEY