TY  - BOOK
AU  - Goodhew, Peter J
AU  - Beanland, R
AU  - Humphreys, F. J
TI  - Electron microscopy and analysis
SN  - 9780748409686
SN  - 37716
U1  - 502.825 GOO 
PY  - 2001///
CY  - New York
PB  - Taylor & Francis
KW  - Electron microscopy
N1  - Includes bibliographical references (p. [236]-237) and index
ER  -