Goodhew, Peter J Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland - 3rd ed - New York Taylor & Francis 2001 - x, 251 p. : ill. ; 24 cm Includes bibliographical references (p. [236]-237) and index ISBN: 9780748409686 ISSN: 37716 Subjects--Topical Terms: Electron microscopy Dewey Class. No.: 502.825 GOO