TY  - BOOK
AU  - Krstić, Angela
AU  - Cheng, Kwang-Ting
TI  - Delay fault testing for VLSI circuits
SN  - 9780792382959
SN  - 98039137
U1  - 621.381548 KRS 
PY  - 1998///
CY  - Dordrecht ; Boston
PB  - Kluwer Academic Publishers
KW  - Delay faults (Semiconductors)
KW  - Integrated circuits - Very large scale integration - Testing
N1  - Includes bibliographical references (p. [173]-188) and index
ER  -