TY  - BOOK
AU  - Griscom, David L
AU  - Pacchioni, G
AU  - Skuja, L
TI  - Defects in SiO₂ and related dielectrics : science and technology
SN  - 9780792366850
SN  - 48787
U1  - 548.85 PAC 
PY  - 2000///
CY  - Boston, MA
PB  - Kluwer Academic Publishers
N1  - Includes bibliographical references and index
ER  -