TY  - BOOK
AU  - Bagraev, Nickolay T
TI  - Defects in semiconductors I : NCDS-1
SN  - 9780878496662
U1  - 621.38152 BAR 
PY  - 1993///
CY  - Zug, Switzerland
PB  - Scitec Publications
KW  - Gitterbaufehler
KW  - Halbleiter
KW  - Semiconductors -- Defects -- Congresses
ER  -