TY  - BOOK
AU  - Fleetwood, D. M
AU  - Pantelides, Sokrates T
AU  - Schrimpf, Ronald Donald
TI  - Defects in microelectronic materials and devices
SN  - 9781420043761
SN  - 200801872
U1  - 621.381 FLE 
PY  - 2009///
CY  - Boca Raton, FL
PB  - CRC Press
KW  - Integrated circuits - Defects
KW  - Metal oxide semiconductor field-effect transistors - Testing
KW  - Microelectronics - Materials - Testing
N1  - Includes bibliographical references and index
ER  -