Defects in microelectronic materials and devices 
edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf 
 - Boca Raton, FL  CRC Press  2009 
 - xvi, 753 p. : ill. ; 26 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781420043761 
<br/><br/><label>ISSN: </label>2008018722 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits - Defects<br/>Metal oxide semiconductor field-effect transistors - Testing<br/>Microelectronics - Materials - Testing
<br/><br/><label>Dewey Class. No.: </label>621.381 FLE