Sachdev, Manoj <br/><br/>
Defect-oriented testing for Nano - Metric CMOS VLSI circuits 
Manoj Sachdev and Jose Pineda de Gyvez 
 - Berlin  Springer  2010 
 - xx, 328p. : ill 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9788184894295 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI
<br/><br/><label>Dewey Class. No.: </label>621.395 SAC