TY  - BOOK
AU  - Russell, Evan
AU  - Braatz, Richard D
AU  - Chiang, Leo H
TI  - Data-driven methods for fault detection and diagnosis in chemical processes
SN  - 9781852332587
SN  - 27317
U1  - 660.2815 RUS 
PY  - 2000///
CY  - Berlin
PB  - Springer
KW  - Chemical process control
KW  - Fault location (Engineering)
N1  - Includes bibliographical references (p. [175]-187) and index
ER  -