Russell, Evan <br/><br/>
Data-driven methods for fault detection and diagnosis in chemical processes 
Evan Russell, Leo H. Chiang and Richard D. Braatz 
 - Berlin  Springer  2000 
 - xiii, 192 p. : ill. 25 cm 
<br/><br/> Includes bibliographical references (p. [175]-187) and index 
<br/><br/><label>ISBN: </label>9781852332587 
<br/><br/><label>ISSN: </label>27317 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemical process control<br/>Fault location (Engineering)
<br/><br/><label>Dewey Class. No.: </label>660.2815 RUS