Joy, David C <br/><br/>
Monte Carlo modeling for electron microscopy and microanalysis 
David C. Joy 
 - Oxford  Oxford University Press  1995 
 - viii, 216 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references 
<br/><br/><label>ISBN: </label>9780195088748 
<br/><br/><label>ISSN: </label>94035642 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy - Computer simulation<br/>Electron probe microanalysis - Computer simulation<br/>Monte Carlo method
<br/><br/><label>Dewey Class. No.: </label>502.825 JOY