Sweeney II, Patrick J <br/><br/>
Comp TIA RFID+ : study guide 
Patrick J. Sweeney II 
 - Hoboken, N.J  Wiley  2007 
 - xxxvii, 294 p. ill. 24 cm 
<br/><br/> Includes indexes 
<br/><br/><label>ISBN: </label>9788126510917 
<br/><br/><label>Dewey Class. No.: </label>658.514 SWE