TY  - BOOK
AU  - Haddara, Hisham
TI  - Characterization methods for submicron MOSFETs
SN  - 9780792396956
SN  - 95050306
U1  - 621.3815284 HAD 
PY  - 1995///
CY  - Dordrecht ; Boston
PB  - Kluwer Academic Publishers
KW  - Electronic circuit design
KW  - Metal oxide semiconductor field-effect transistors - Mathematical models
N1  - Includes bibliographical references and index
ER  -