Characterization methods for submicron MOSFETs 
edited by Hisham Haddara 
 - Dordrecht ; Boston  Kluwer Academic Publishers  1995 
 - vii, 232 p. : ill. ; 24 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780792396956 
<br/><br/><label>ISSN: </label>95050306 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic circuit design<br/>Metal oxide semiconductor field-effect transistors - Mathematical models
<br/><br/><label>Dewey Class. No.: </label>621.3815284 HAD