Beam Injection Assessment of Microstructures in Semiconductors : BIAMS 2000 : proceedings of the 6th international workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 
editors: Hajime Tomokage and Takashi Sekiguchi 
 - Uetikon-Zuerich, Switzerland  Scitec Publications  2001 
 - xiii, 441 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783908450610 
<br/><br/><label>ISSN: </label>2001277780 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors - Defects - Congresses<br/>Semiconductors - Microscopy - Congresses<br/>Semiconductors - Testing - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.38152 TOM