Beam effects, surface topography, and depth profiling in surface analysis 
edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell 
 - New York  Plenum Press  c1998 
 - xix, 430 p. : ill. ; 24 cm. 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780306458965 
<br/><br/><label>ISSN: </label>98041250 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials - Effect of radiation on<br/>Surfaces (Technology) - Analysis
<br/><br/><label>Dewey Class. No.: </label>620.44 CZA