VLSI test principles and architectures : design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

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Publication details: Amsterdam ; Boston Elsevier, Morgan Kaufmann Publishers 2006Description: xxx, 777 p. : ill. ; 25 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.395 WAN (Browse shelf(Opens below))	Available		340117

Includes bibliographical references and index

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