Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA Peisen S. Huang, chair/editor ; sponsored and published by by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE 2006Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 HUA (Browse shelf(Opens below))	Available		278217

Includes bibliographical references and author index

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