Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE 2005Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

9780819460240

ISSN:

2006276029

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DDC classification:

681.25 HAR

Item type: Books

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Anna Centenary Library	681.25 HAR (Browse shelf(Opens below))	Available		278216

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Previous	681.25 HAK Videometrics VI : 28-29 January, 1999, San Jose, California	681.25 HAR Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA	681.25 HAR Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts	681.25 HAR Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA	681.25 HAR Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA	681.25 HOL High energy, optical, and infrared detectors for astronomy IV : 27-30 June 2010, San Diego, California United States	681.25 HOP A guide to the use and calibration of detector array equipment	Next

Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology. Includes bibliographical references and author index

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Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

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