Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

Contributor(s):

Harding, Kevin G
Society of Photo-optical Instrumentation Engineers

Publication details: Bellingham, WA SPIE 2005Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

9780819460240

ISSN:

2006276029

Subject(s):

Computer vision - Congresses
Imaging systems - Congresses
Metrology - Congresses
Optical measurements - Congresses
Quality control - Optical methods - Congresses
Three-dimensional display systems - Congresses

DDC classification:

681.25 HAR

Item type: Books

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Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 HAR (Browse shelf(Opens below))	Available		278216

Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology. Includes bibliographical references and author index

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Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

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