Measurement and modeling of silicon heterostructure devices edited by John D. Cressler

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Publication details: Boca Raton, FL CRC Press 2008Description: 1 v. (various pagings) : ill. ; 27 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.38152 CRE (Browse shelf(Opens below))	Available		151430

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Previous	621.38152 CHE Plasma charging damage	621.38152 CHO Nanostructered films and coatings : [proceedings of the NATO advanced research workshop on Nanostructured films and Coatings, Santorini, Greece, June 28-30, 1999]	621.38152 COL Modern physics for semiconductor science	621.38152 CRE Measurement and modeling of silicon heterostructure devices	621.38152 CRI Electrical characterization of silicon-on-insulator materials and devices	621.38152 DAB Predictive simulation of semiconductor processing : status and challenges	621.38152 DAS Semiconductor devices: modelling and technology	Next

Includes bibliographical references and index

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