Reflection electron microscopy and spectroscopy for surface analysis Zhong Lin Wang

By:

Wang, Zhong Lin

Language: English Publication details: New York Cambridge University press 1996Description: xix, 436 p.: ill.: 24 cmISBN:

9780521482660

DDC classification:

620.44 LIN

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Item type	Current library	Call number	Status	Barcode
Reference	Anna Centenary Library 6TH FLOOR, A WING	620.44 LIN (Browse shelf(Opens below))	Not for loan	104353

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Reflection electron microscopy and spectroscopy for surface analysis

APA

Wang Z. L., . (1996). Reflection electron microscopy and spectroscopy for surface analysis. New York: Cambridge University press.

Chicago

Wang Zhong Lin, . 1996. Reflection electron microscopy and spectroscopy for surface analysis. New York: Cambridge University press.

Harvard

Wang Z. L., . (1996). Reflection electron microscopy and spectroscopy for surface analysis. New York: Cambridge University press.

MLA

Wang Zhong Lin, . Reflection electron microscopy and spectroscopy for surface analysis. New York: Cambridge University press. 1996.

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