Reliability, Packaging, Testing, And Characterization Of Mems/moems Vi : 23-24 January, 2007, San Jose, California, Usa / edited by Allyson L. Hartzell, Rajeshuni Ramesham

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Language: English Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 6463Publication details: Bellingham Spie c2007Edition: 1st edDescription: ix, (various pagings) : ill. ; 29 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Reference	Anna Centenary Library 6TH FLOOR, B WING	621.381 HAR (Browse shelf(Opens below))	Not for loan	278140

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Previous	621.3675 BJE Selected Papers On Holographic Recording Materials	621.3675 MAI Selected Papers On Subwavelength Diffractive Optics	621.3678 MEY Sensors, Systems, And Next-generation Satellites Xi : 17-20 September 2007, Florence, Italy	621.381 HAR Reliability, Packaging, Testing, And Characterization Of Mems/moems Vi : 23-24 January, 2007, San Jose, California, Usa	621.381 VAR Smart Structures And Materials 2001 : Smart Electronics, Mems	621.381045 KUB Silicon Photonics : 25-26 January 2006, San Jose, California, Usa	621.3813 ANW Terahertz Physics, Devices, And Systems : 2-4 October 2006, Boston, Massachusetts, Usa :	Next

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