Testing Static Random Access Memories : defects, fault models and test patterns Said Hamdioui

Language: English Publication details: Boston Kluwar Academic Publishers 2004Description: xx, 221 p. 24 cmISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Barcode
Reference	Anna Centenary Library 3RD FLOOR, A WING	004.53 HAM (Browse shelf(Opens below))	Not for loan	299557

Includes index

There are no comments on this title.

to post a comment.

Find us on the map