Mathematical methods in pattern and image analysis : 3-4 August, 2005, San Diego, California, USA Jaakko T. Astola, Ioan Tǎ̌bus̨, Junior Barrera, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE 2005Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.367 AST (Browse shelf(Opens below))	Available		423965

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