Random testing of digital circuits : theory and applications René David

By:

Publication details: New York Marcel Dekker 1998Description: xix, 475 p. : ill. ; 24 cmISBN:

ISSN:

Subject(s):

DDC classification:

Item type: Books

Tags from this library: No tags from this library for this title.

Average rating: 0.0 (0 votes)

Holdings
Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.3815 DAV (Browse shelf(Opens below))	Available		144907

Previous				No cover image available				Next
Previous	621.3815 CRE Analog electronics: circuits, systems and signal processing	621.3815 CUT Electronic circuits for the evil genius	621.3815 CUT Electronic circuits for the evil genius : 64 lessons with projects	621.3815 DAV Random testing of digital circuits : theory and applications	621.3815 DIF Electronic devices : systems and applications	621.3815 DOR Integrated modeling of chemical mechanical planarization for sub-micron IC fabrication : from particle scale to feature, die and wafer scales	621.3815 DUF Analog test signal generation using periodic [sigma delta]-encoded data streams	Next

Includes bibliographical references (p. 447-461) and index

There are no comments on this title.

to post a comment.

Find us on the map