Random testing of digital circuits : theory and applications René David

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Publication details: New York Marcel Dekker 1998Description: xix, 475 p. : ill. ; 24 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.3815 DAV (Browse shelf(Opens below))	Available		144907

Includes bibliographical references (p. 447-461) and index

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