Metrology and Diagnostic Techniques for Nanoelectronics Mudiwa Afolayan

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Language: English Publication details: New York Scitus Academics LLC 2018Description: vi, 296p. ill. 28cmISBN:

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Item type: English Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library 6TH FLOOR, A WING	620.5 AFO (Browse shelf(Opens below))	Available		617530

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