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Proceedings of the 7th international autumn meeting gettering and defect engineering in semiconductor technology : GADEST '97, Spa, Belgium, October 5-10, 1997 editors, and C. Claeys ... [et al.]

Contributor(s): Publication details: Zurich ; Enfield, N.H Scitec Pub. Ltd. ; Trans Tech Pub. Ltd. [distributor] [1997]Description: xv, 538 p. : ill. ; 25 cmISBN:
  • 9783908450276
ISSN:
  • 99221384
Subject(s): DDC classification:
  • 537.622 CLA
Item type: Books
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