Search the Library Catalogue
Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|
Anna Centenary Library | 621.381548 PAT (Browse shelf(Opens below)) | Available | 326849 |
621.381548 MOU Principles of testing electronic systems | 621.381548 OLI Electronic measurements and instrumentation | 621.381548 OSS Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard | 621.381548 PAT Principles of electronic instrumentation | 621.381548 PRA Practical design verification | 621.381548 PUT Electronic measurement systems : theory and practice | 621.381548 RAY Metrology, inspection, and process control for microlithography XXIV : 22-25 February 2010, San Jose, California, United States |
Includes bibliographical references (p. 555-559) and index
There are no comments on this title.