Search the Library Catalogue
Power-constrained testing of VLSI circuits by Nicola Nicolici and Bashir M. Al-Hashimi
Publication details: Boston Kluwer Academic Publishers 2003Description: xi, 178 p. : ill. ; 25 cmISBN:- 9781402072352
- 2002043306
- 621.3950287 NIC
| Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|
| Anna Centenary Library | 621.3950287 NIC (Browse shelf(Opens below)) | Available | 299732 |
Browsing Anna Centenary Library shelves Close shelf browser (Hides shelf browser)
| 621.395028553 KUR Logic synthesis using synopsys | 621.3950285573 MIN Binary decision diagrams and applications for VLSI CAD | 621.3950287 CHE Efficient branch and bound search with application to computer-aided design | 621.3950287 NIC Power-constrained testing of VLSI circuits | 621.3950287 SIV A unified approach for timing verification and delay fault testing | 621.395077 FRE Crash course in digital technology | 621.3967 ORL Optical data storage 2010 : 23-26 May 2010, Boulder, Colorado, United States |
Includes bibliographical references (p. 163-173) and index
There are no comments on this title.
Log in to your account to post a comment.