Optical measurement systems for industrial inspection IV : 13-17 June 2005, Munich, Germany Wolfgang Osten, Christophe Gorecki, Erik Novak, chairs/editors ; sponsored by, SPIE Europe ; cooperating organizations, European Optical Society ; published by SPIE--the International Society for Optical Engineering

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Publication details: Bellingham, WA SPIE c2005Description: 2 v. (xviii, 1048 p. ) : ill. ; 28 cmISBN:

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Includes bibliographical references and author index

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