Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard edited by Adam Osseiran

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Publication details: Boston Kluwer Academic Publishers 1999Description: xviii, 155 p. : ill. ; 24 cmISBN:

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Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.381548 OSS (Browse shelf(Opens below))	Available		301763

Includes bibliographical references and index

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