Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA Lahsen Assoufid, Peter Z. Takacs, Masaru Ohtsuka, editors, ; sponsored and published by SPIE

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Publication details: Bellingham, Wash SPIE c2007Description: 1 v. (various pagings) : ill. ; 28 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	681.25 ASS (Browse shelf(Opens below))	Available		276762

Includes bibliographical references and author index

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